Add a new overlay trend to the display

AVEVA PI Vision automatically selects which attributes to display as Overlay Trends. You can add new Overlay Trends by dragging additional event attributes to the display. Drop an event attribute on an existing trend to see a combined view, or drop it above or below an existing trend to see it on a separate trend. You can have both combined and separated attributes in an event comparison. For example, you might want to see internal temperature mold temperature together on one trend and pressure on a separate trend. An attribute can only be displayed once on an event comparison display.

The Attributes pane lists all of the event's attributes. The last item in the Attributes pane is the event's referenced asset. A referenced asset is the asset that the event is associated with. You can view all of the referenced asset's attributes by clicking the triangle next to the asset.

1. Select an attribute that you want to trend from the Attributes pane and drag it onto an Overlay Trend. Drop the attribute on an existing trend to see a combined trend or drop it above or below existing trends to see it on a separate trend. A green line around the attribute indicates a valid location to drop it.

   The Attributes pane shows each attribute's value at the start time of the event.

   

   Note: If you do not see the attribute you are looking for, click the triangle next to the asset at the bottom of the Attributes pane to view a full list of attributes.

2. The trend for the dragged attribute appears on the overlay trend with multiple color-coded traces. Each trace represents the same attribute’s process behavior during multiple related events.

   

   If the trend shows multiple attributes, the axis shows values for the first attribute, then the minimum and maximum value for each additional attribute in the order shown at the top of the trend. Click on attribute to highlight its scale.

3. Select an event in the Events pane to highlight its trace on the overlay trend.