Glossary
- Last UpdatedAug 05, 2025
- 3 minute read
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C |
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C Bar |
The average for counted attribute characteristics as a count. |
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Characteristic |
A characteristic is an aspect of an item, process, or physical entity that can be measured. You can configure characteristics for variables and attributes, and associate them with categories. |
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Consumption |
Items consumed in the plant floor. |
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Context |
One or more aspects of a situation when quality data is gathered, such as the entity, entity class, or item that determines which QM specification is applicable. |
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Cp |
The ratio of the difference between the upper and lower specification limits and six times the estimated standard deviation based on sample variability. |
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CpK |
The ratio of the difference between the upper and lower specification limits and six times the estimated standard deviation based on sample variability. |
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D |
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Defects Per Million Opportunities (DPMO) |
The average count of defects for every 1 million opportunities, where a single unit may have more than 1 opportunity for a specific defect. This value is only applicable for counted attribute characteristics. |
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Defects Per Million Opportunities (DPMO) Chart |
A chart of the number of defects per million opportunities of a series of samples for a certain (counted attribute) characteristic. |
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F |
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Fraction Defective |
The ratio of defects to sample size, for a single sample point. |
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L |
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LRL |
The lower reasonable limit for a specification. You are not allowed to enter results lower than this. |
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M |
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Moving Average |
A value that specifies the average of individual readings from a certain number of consecutive individual readings. |
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Moving Average Bar |
A value that specifies the average of moving averages. |
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Moving Range |
A value that specifies the difference between the highest and lowest individual readings among a certain number of consecutive individual readings. |
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Moving Sigma |
A value that specifies the standard deviation (σ) from a certain number of consecutive individual readings. |
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N |
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NP Bar |
The average for binary attribute characteristic as a count. |
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NP Chart |
A chart of the count of the number of defective units from a series of samples for a specific (binary attribute) characteristic. |
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P |
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P Bar |
The average for a binary attribute characteristic as a ratio to sample size. |
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P Chart |
A chart of the proportion of defective units for a series of samples for a specific (binary attribute) characteristic. Being normalized to the equivalent for a single unit, it allows samples of different sizes to be compared. |
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Path |
The hierarchy of files through which control passes to find a particular file. |
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Pp |
The ratio of the difference between the upper and lower specification limits and six times the estimated standard deviation based on the entire measured population. |
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PpK |
The ratio of the difference between the upper and lower specification limits and six times the estimated standard deviation based on the entire measured population. |
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R |
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R Bar |
A value that specifies the average range of values from various samples. |
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S |
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Sample Average |
A value that gives the average of the set of results for a particular characteristic of a sample. |
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Sample Size |
Total number of measurements in a sample. |
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Specification |
A description of desired results related to a manufacturing operation or product. |
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StdDev (σ) |
A value that specifies the statistical measure of spread or variability. |
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U |
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U Bar |
The average for counted attribute characteristics as a ratio to sample size. |
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U Chart |
A chart of defects per unit for a series of samples for a particular (counted attribute) characteristic. Being normalized to the equivalent for a single unit, it allows samples of different sizes to be compared. |
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Upper Reasonable Limit (URL) |
The upper reasonable limit for a specification. You are not allowed to enter results higher than this. |